专利名称:Volumetric integrated circuit and volumetric
integrated circuit manufacturing method
发明人:Daniel C. Edelstein,Michael A.
Gaynes,Thomas M. Shaw,Bucknell C.Webb,Roy R. Yu
申请号:US14221477申请日:20140321公开号:US09583410B2公开日:20170228
专利附图:
摘要:A volumetric integrated circuit manufacturing method is provided. The method
includes assembling a slab element of elongate chips, exposing a wiring layer betweenadjacent elongate chips of the slab element, metallizing a surface of the slab element atand around the exposed wiring layer to form a metallized surface electrically coupled tothe wiring layer and passivating the metallized surface to hermetically seal themetallized surface.
申请人:International Business Machines Corporation
地址:Armonk NY US
国籍:US
代理机构:Cantor Colburn LLP
代理人:Louis Percello
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