Automated test case generation for applications

专利名称：Automated test case generation for

applications

发明人：Suresh Chandra Gupta申请号：US14287902申请日：20140527公开号：US09268672B1公开日：20160223

专利附图：

摘要：Some implementations include receiving an application binary file for anapplication to be tested. One or more static analysis operations may be performed onthe application binary file to identify application parameters. In some cases, keywords

may be associated with individual application parameters, and the keywords may be usedto query a test case repository in order to identify test cases. The identified test casesmay be used to generate a test plan, and at least a portion of the test plan may beautomatically executed in some cases. A test report may be generated that includes a listof test case failures and potential solutions, and the test report may be sent e.g., to athird-party developer or an approval engineer for review.

申请人：Amazon Technologies, Inc.

地址：Reno NV US

国籍：US

代理机构：Lee & Hayes, PLLC

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